Cetin Cetinkaya
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- Sorted by Year/Conf, Year/Citation, Citation
| 2006 | ||
|---|---|---|
| 1 | Frequency domain thickness measurement approach for microscale multilayered structures. Chen Li, Cetin Cetinkaya. IEEE T. Instrumentation and Measurement (55): 206-211 (2006). Web SearchBibTeXDownload | |
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