François-Fabien Ferhani
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- Sorted by Year/Conf, Year/Citation, Citation
| 2008 | ||
|---|---|---|
| 3 | How Many Test Patterns are Useless?. François-Fabien Ferhani, Nirmal R. Saxena, Edward J. McCluskey, Phil Nigh. VTS 2008, 23-28. Web SearchBibTeXDownload | |
| 2006 | ||
| 2 | Classifying Bad Chips and Ordering Test Sets. François-Fabien Ferhani, Edward J. McCluskey. ITC 2006, 1-10. Web SearchBibTeXDownload | |
| 2004 | ||
| 1 | ELF-Murphy Data on Defects and Test Sets. Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, François-Fabien Ferhani, Edward Li, Subhasish Mitra. VTS 2004, 16-22. Web SearchBibTeXDownload | |
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