Hai-fan Hu
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- Sorted by Year/Conf, Year/Citation, Citation
| 2011 | ||
|---|---|---|
| 2 | Improved performance of trench power MOSFET with SiGeC-based channel. Ying Wang, Hai-fan Hu, Chao Cheng. Microelectronics Reliability (51): 376-380 (2011). Web SearchBibTeXDownload | |
| 1 | Investigation of power Trench MOSFETs with retrograde body profile. Ying Wang, Chao Cheng, Hai-fan Hu. Microelectronics Reliability (51): 513-516 (2011). Web SearchBibTeXDownload | |
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