Percy G. Dias
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- Sorted by Year/Conf, Year/Citation, Citation
| 1997 | ||
|---|---|---|
| 1 | Testability Prediction for Sequential Circuits Using Neural Network. Shiyi Xu, Peter Waignjo, Percy G. Dias, Bole Shi. Asian Test Symposium 1997, 48. Web SearchBibTeXDownload | |
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