Sammy Kayali
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- Sorted by Year/Conf, Year/Citation, Citation
| 2005 | ||
|---|---|---|
| 1 | A statistical approach to characterizing the reliability of systems utilizing HBT devices. Yuan Chen, Qing Wang, Sammy Kayali. Microelectronics Reliability (45): 1869-1874 (2005). Web SearchBibTeXDownload | |
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