Shi-Jie Wen
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- Sorted by Year/Conf, Year/Citation, Citation
| 2011 | ||
|---|---|---|
| 1 | Performance, metastability and soft-error robustness tradeoffs for flip-flops in 40nm CMOS. David Rennie, David Li, Manoj Sachdev, Bharat L. Bhuva, Srikanth Jagannathan, Shi-Jie Wen, Rick Wong. CICC 2011, 1-4. Web SearchBibTeXDownload | |
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