Sundar Chetlur
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- Sorted by Year/Conf, Year/Citation, Citation
| 2001 | ||
|---|---|---|
| 2 | Hot-carrier-Induced Circuit Degradation for 0.18 µm CMOS Technology. Wei Li, Qiang Li, J. S. Yuan, Joshua McConkey, Yuan Chen, Sundar Chetlur, Jonathan Zhou, A. S. Oates. ISQED 2001, 284-289. Web SearchBibTeXDownload | |
| 1 | Hot-carrier-Induced Circuit Degradation for 0.18 ?m CMOS Technology. Wei Li, Qiang Li, J. S. Yuan, Joshua McConkey, Yuan Chen, Sundar Chetlur, Jonathan Zhou, A. S. Oates. ISQED 2001, 284-289. Web SearchBibTeXDownload | |
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