Varsha Balakrishnan
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| 2009 |
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| 5 | A framework for estimating NBTI degradation of microarchitectural components. Michael DeBole, Krishnan Ramakrishnan, Varsha Balakrishnan, Wenping Wang, Hong Luo, Yu Wang, Yuan Xie, Yu Cao, Narayanan Vijaykrishnan. ASP-DAC 2009, 455-460. Web SearchBibTeXDownload |
| 4 | Circuit aging prediction for low-power operation. Rui Zheng, Jyothi Velamala, Vijay Reddy, Varsha Balakrishnan, Evelyn Mintarno, Subhasish Mitra, Srikanth Krishnan, Yu Cao. CICC 2009, 427-430. Web SearchBibTeXDownload |
| 3 | New-Age: A Negative Bias Temperature Instability-Estimation Framework for Microarchitectural Components. Michael DeBole, Krishnan Ramakrishnan, Varsha Balakrishnan, Wenping Wang, Hong Luo, Yu Wang, Yuan Xie, Yu Cao, Narayanan Vijaykrishnan. International Journal of Parallel Programming (37): 417-431 (2009). Web SearchBibTeXDownload |
| 2 | On the efficacy of input Vector Control to mitigate NBTI effects and leakage power. Yu Wang, Xiaoming Chen, Wenping Wang, Varsha Balakrishnan, Yu Cao, Yuan Xie, Huazhong Yang. ISQED 2009, 19-26. Web SearchBibTeXDownload |
| 2008 |
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| 1 | Optimized Circuit Failure Prediction for Aging: Practicality and Promise. Mridul Agarwal, Varsha Balakrishnan, Anshuman Bhuyan, Kyunglok Kim, Bipul C. Paul, Wenping Wang, Bo Yang, Yu Cao, Subhasish Mitra. ITC 2008, 1-10. Web SearchBibTeXDownload |
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